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R&D

FA Engineer with X-Ray -Inspection Expertise

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Haifa

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Full time

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Haifa

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Full time

Mobileye is seeking a skilled Failure Analysis (FA) Engineer with expertise in X-ray inspection techniques to join our AV Platform team. The ideal candidate will specialize in using advanced X-ray imaging and other analysis methods to investigate product failures, identify root causes, and provide actionable insights to improve product quality and reliability

What will your job look like?

  • Perform detailed failure analysis using X-ray imaging systems and related diagnostic tools to inspect electronic components, assemblies, and materials.
  • Interpret and analyze X-ray images to detect structural anomalies, defects, voids, cracks, delamination, and other failure mechanisms.
  • Develop and optimize X-ray inspection procedures and protocols for failure analysis and quality control.
  • Prepare test specimens: cutting, mounting, grinding, polishing and chemical etching
  • Collaborate with product engineering, quality assurance, and manufacturing teams to support product development, troubleshooting, and continuous improvement efforts.
  • Prepare detailed technical reports documenting findings, root cause analyses, and recommended corrective actions.
  • Support reliability testing and failure mode analysis for new and existing products.

All you need is:

  • Bachelor’s or Master’s degree in Materials Science, Electrical Engineering, Mechanical Engineering, Physics, or related field.
  • Proven experience in failure analysis with a strong focus on X-ray imaging and inspection.
  • Proficiency in operating and interpreting data from X-ray inspection systems (e.g., 2D/3D X-ray CT).
  • Strong analytical and problem-solving skills with attention to detail.
  • Familiarity with semiconductor, electronics, or other relevant industry standards.
  • Excellent communication skills for reporting technical findings clearly and effectively.
  • Ability to work independently and as part of a cross-functional team.
  • Experience with complementary failure analysis tools e.g., SEM, FIB and optical microscopy

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Evolution as
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